모델 CombiScope
투명재질, BIOLOGY 측정분석용 SPM(=AFM)
특징: 전자동셋업, 고속 측정, 현존하는 SPM(=AFM)중 최고기술!
Extraordinary productivity and easy operation
CombiScope is equipped with the fully motorized cantilever holder and photodiode positioning that provides the automated click-on-a-button laser-to-tip alignment. This option dramatically simplifies the entire system adjustment process and provides the highest level of system adjustment reproducibility. In addition, after you installed a new cantilever of the same or even different type , the same spot (within a few microns repeatability) on your sample surface can be easily found and scanned without any extra searching steps.
Top level scanner
The CombiScope utilizes the closed loop, high-dynamics, 3-axis piezo-nanopositioning scanner from the leader in precision motion control, Physik Instrumente. The top level scanner is the heart of the system which enables it to achieve very high levels of linearity, highest possible stiffness and extremely high precision motion.
1300 nm AFM laser
The use of 1300nm AFM laser eliminates any interference with VIS light-sensitive biological and semiconductor samples. It also makes it possible to perform simultaneous AFM and fluorescence or Raman scattering measurements without any crosstalk for most popular UV-VIS-NIR (364-830 nm) excitation lasers.
Solutions for working in liquid
The standard CombiScope’s sample holders accommodates all common sample substrates, including slides, cover slips and 35mm Petri dishes. The specially design liquid cell with heating and liquid perfusion capabilities enables for biological samples to be delicately maintained in their physiological environment and at temperatures up to 60°C.
All operating modes in one single instrument
The CombiScope comes with all modern AFM operating modes in one single instrument, without any extra costs and units, including such application-specific modes as force and electric nanolithographies, piezoelectric force microscopy (PFM), Kelvin Probe Microscopy and frequency modulation AFM (dynamic force microscopy with built-in PLL). In addition, the scanning tunneling microscopy (STM) head and Conductive AFM unit operating in the range 100fA ÷ 10uA (with 1nA, 100na and 10uA subranges software switchable and current noise of 60fA RMS for 1nA subrange) and near-field optical microscopy (SNOM) head are available as the options. Such exceptional versatility of the instrument makes it a perfect solution for nanoscience.
Integration with optics
Besides integrated inverted optical microscope such as Nikon Eclipse Ti-U and Olympus IX-71 with Phase Contrast and DIC, the CombiScope can be equipped with the head which provides the top and side simultaneous optical access with planapochromat objectives (100x, NA=0.7 and 10x, NA=0.28 respectively). This option opens up the way to combine the upright and transmission configurations to study transparent as well as non-transparent samples with optical, Raman and scanning probe microscopy techniques.
지난 30여년간 국내 Tribology(마찰/마모/연마/윤활), 스크래치 마이크로 물성 고온 경도계, 베어링시험기, 3차원표면 형상측정기 내외경 측정기, 열_분석기, 열경화 시험기 등을 국내에 공급해오면서 기술산업 발전에 조금이나마 노력하여 왔습니다. 미.일.유럽 소재, 유명 제조공급사인 BRUKER, PHOENIX TRIBOLOGY, KEP, SETARAM, SETSMARMT, INNOWEP, TABER, AMTEC, WALKWAY, ANFATEC, SHINTO-HEIDON, ENEOS MATERIALS, TRICO사의 최첨단 장비들을 국내에 소개 및 판매 기술 지원하여 왔으며, 또한 이기술을 바탕으로 일부 품목 제조를 통하여 국산화에도 노력하여 왔습니다.
서울특별시 송파구 정의로 7길 13 (문정동 639-5), 힐스테이트에코송파 오피스동 409호. 문정역 4번 출구에서 5분 거리
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